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RE46C180
DS22275A-page 10
?2011 Microchip Technology Inc.
2.0
PIN DESCRIPTIONS
The descriptions of the pins are listed in Table 2-1.
 
TABLE 2-1:
PIN FUNCTION TABLE
RE46C180
PDIP, SOIC
Symbol
Function
1
TEST
This input is used to invoke Push-to-Test, Timer mode and Alarm Memory
Indication. This input has an internal pull-down.
2
IO
This bidirectional pin provides the capability to interconnect many detectors
in a single system. This pin has an internal pull-down device and a charge
dump device.
3
GLED
Open drain NMOS output, used to drive a visible LED to provide visual
indication of an Alarm Memory condition.
4
CHAMBER
Connect to the ionization smoke chamber. This pin provides power to the
chamber
5
RLED
Open drain NMOS output, used to drive a visible LED. This pin provides the
load current for the Low Battery test, and is a visual indicator for alarm and
HUSH mode.
6
V
DD
Connect to the positive supply voltage
7
TESTOUT
This output is an indicator of the internal IO dump signal. This pin is also
used for Test modes.
8
FEED
Usually connected to the feedback electrode through a current limiting
resistor. If not used, this pin must be connected to V
DD
 or V
SS
.
9
V
SS
Connect to the negative supply voltage.
10
HB
This pin is connected to the metal electrode of a piezoelectric transducer.
11
HS
This pin is a complementary output to HB, connected to the ceramic
electrode of the piezoelectric transducer.
12
T2
Test input to invoke Test modes. This pin has an internal pull-down.
13
T3
Test output for Test modes.
14
GUARD1
Output of the guard amplifier. This allows for measurement of the DETECT
input without loading the ionization chamber.
15
DETECT
Connect to the CEV of the ionization smoke chamber.
16
GUARD2
Output of the guard amplifier. This allows for measurement of the DETECT
input without loading the ionization chamber.
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